Nuclear Instruments and Sinerlab developed a Digital Pulse Processor (DPP) with integrated 16k-Multichannel Analyzer
ready to use for laboratory and OEM integration.
The DPP-2570 Digital Pulse Processor can be used in applications requiring high resolution energy measurements like X-ray flourescence or
It works with all transistor reset detectors like Aptek SiPM XR-100CR or Moxtek XPIN.
It integrates an analog shaper and amplifier, an HV voltage generator (up to 250V), programmable gain amplfier, 150 MSPS 14 bit ADC and FPGA based DPP algorithm
Sinerlab SRL has developed an Automatic identification of
elements through peak analysis software that works perfectly with Nuclear Instruments DPP2570 MCA.
Sinerlab as also developed a XRF instrument, Siner X is an X-ray fluorescence spectrometer devoted to the analysis of materials, that integrates the DPP2570.
- Analog Input:
- Supported Detector: SiPIN, SDD, HpGE
- BNC connector
- Single ended, AC coupled
- Pulsed reset preamplifiers supported
- Impedance: 50 Ohm / 1 kOhm (sw selectable)
- 5/10V input ramp range
- Programmable 4-step analog coarse gain: 2, 5, 15, 50
- Shaper amplifier: 600ns for high rate applications or 100us for high resolution measurament
- Trimmer to compensate the preamplifier zero
- Programmable fine gain: 0...10
- Programmable DC offset adjustment on the input in the full scale range
- Detector Bias:
- 80...250V Power Supply
- less then 1mVpp ripple
- 100mV accurancy
- Detector peltier control, up to 5V, 2A
- Detector temperature monitor
- Resolution: 14 bits
- Sampling rate: 150 MS/s
- Digital Signal Processing
- Trigger with advanced noise rejection algorithm based on second derivate of the signal
- Manual and automated Pole-Zero cancellation; decay time up to 0.65 ms
- Pile-up rejection and Live Time correction
- Digital fine gain
- Trapezoidal shaper: up to 60us peaking time.
- Baseline restorer with programmable averaging
- Adjustable moving average low pass filter to reduce the high frequency noise
- Operating Modes
- Pulse Height Analysis (PHA): 16k-channel pulse height histogram internally built up; 1k-2k-4k-8k-16k rebin options at software level
- Oscilloscope mode for waveforms monitoring
- Trigger Modes
- Internal trigger
- Communication interface
- USB 2.0 compliant
- Firmware can be upgraded via USB
- C/C++ library Windows and Linux
- .NET (VB.NET) open source Demo Software
- Supported by Sinerlab SinRX software
- Dimensions: 106 W x 38 H x 128 L mm³
- Weight: 300g
FIRMWAREThe digitized signal is sent to a programmable decimator that enables the instrument to implement filters with a length up to 64 us. The output of the decimation stage is then deconvolved by a three zeros digital deconvolutor circuit. An innovative algorithm automatically calculates the poles of the input signal to find the best zeros position on the z-plane. The deconvolved signal is split and sent to the triggering and processing units. The trigger circuit consists of a fast trapezoidal filter with discrimination. The signal is simultaneously processed by an energy filter with programmable trapezoidal shape that lasts from 40 ns to 40 us. Pileup and saturation circuit are also implemented. The reference level (baseline) of the pulses is estimated and subtracted to the corresponding energy measure. The corrected energy values are collected in a histogram of 16k channels into the FPGA device. The FPGA is connected both to a microcontroller and to a USB interface. The microcontroller is devoted to managing the Ethernet LAN and WiFi.
- Automatic identification of elements through peak analysis
- Fitting trough gaussian curves using a Levenberg-Marqaart algorithm with possibility to use modified gaussian curves to take into account the line shelf and tail.
- Automatic identification of “sum” and “escape” peaks.
- Standardless - fundamental parameters of:
- Different tube spectra models available (for both end-window and side-window X-ray tubes)
- Detector efficiency spectrum adjustable by the user
- Possibility to choose and save the geometry of analysis
- Smart analysis: for the rapid identification of the material, with possibility of creating a customized database of materials
- Analysis with standards:
- Empirical calibration curves (linear and quadratic models), with or without interelement corrections
- Lucas-Tooth algorithm
- Lachance-Traill algorithm
- Modified fundamental parameters analysis to take into account the results on standard sample
- Combined methods: FP + empirical calibration